規格 | 4Mx16 |
---|---|
電壓 | 1.7-1.95V |
速度(ns) | 70 |
腳位/封裝 | VFBGA(54) |
狀態 | Prod |
評注 | CRAM 1.5 |
產品系列 | 66 = Pseudo SRAM |
硅片版本 | E |
焊接 | L = 無鉛 |
温規 | I = 工業級 (-40C to +85°C) |
外包裝 | 卷轴包 |
IS66WVC4M16ECLL-7008BLI-TR 特徵
- Single device supports asynchronous , page, and burst operation
- Mixed Mode supports asynchronous write and synchronous read operation
-
Dual voltage rails for optional performance
- ALL: VDD 1.7V~1.95V, VDDQ 1.7V~1.95V
- CLL: VDD 1.7V~1.95V, VDDQ 2.7V~3.6V
- Asynchronous mode read access : 70ns Interpage Read access : 70ns Intrapage Read access : 25ns
-
Burst mode for Read and Write operation
- 4, 8, 16,32 or Continuous
-
Low Power Consumption
- Asynchronous Operation < 30 mA
- Intrapage Read < 20mA
- Burst operation < 35 mA (@104Mhz)
- Standby < 180 uA (max.)
- Deep power-down (DPD) < 3uA (Typ)
-
Low Power Feature
- Reduced Array Refresh
- Temperature Controlled Refresh
- Deep power-down (DPD) mode
- Operation Frequency up to 104Mhz
- Operating temperature Range Industrial: -40°C~85°C Automotive A1: -40°C~85°C
概觀
The IS66WVC4M16EALL/CLL is an integrated memory device containing 64Mbit Pseudo Static Random Access Memory using a self-refresh DRAM array organized as 4M words by 16 bits. The device includes several power saving modes : Reduced Array Refresh mode where data is retained in a portion of the array and Temperature Controlled Refresh. Both these modes reduce standby current drain. The device can be operated in a standard asynchronous mode and high performance burst mode. The die has separate power rails, VDDQ and VSSQ for the I/O to be run from a separate power supply from the device core.